journal：IEEE Transactions on Instrumentation and Measurement
Authors：Deepti Sharma; Sachin Kumar; Neeta Singh; Binod Kumar Kanaujia; Satya P. Singh; Aimé Lay-Ekuakille
Published date：2023--
DOI：10.1109/tim.2023.3302377
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10210293
Article link：http://dx.doi.org/10.1109/tim.2023.3302377
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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