journal:Chinese Journal of Electronics
Authors:Kejuan Yue; Beiji Zou; Lei Wang; Xiao Li; Min Zeng; Faran Wei
Published date:2017-5-
DOI:10.1049/cje.2017.04.005
PDF link:https://onlinelibrary.wiley.com/doi/pdf/10.1049/cje.2017.04.005
Article link:http://dx.doi.org/10.1049/cje.2017.04.005
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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