journal:2018 International Conference on Biometrics (ICB)
Authors:Jiyun Cui; Hao Zhang; Hu Han; Shiguang Shan; Xilin Chen
Published date:2018-2-
DOI:10.1109/icb2018.2018.00031
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=8411215
Article link:http://dx.doi.org/10.1109/icb2018.2018.00031
Article Source:IEEE。
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