journal:IEEE Transactions on Instrumentation and Measurement
Authors:Joseph Mathew; N. Sivakumaran; P. A. Karthick
Published date:2023--
DOI:10.1109/tim.2023.3323988
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10285511
Article link:http://dx.doi.org/10.1109/tim.2023.3323988
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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