[Other] Using hard-x-ray photoelectron spectroscopy to measure the oxidation state of gated Co/AlOx interfaces

 Close Closed
kammi Post time 4 day(s) ago | Show all posts |Read mode
Reward20points

journal:Physical Review Applied

Authors:Cristina Balan; Johanna Fischer; Capucine Gueneau; Aymen Fassatoui; Jean-Pascal Rueff; Denis Ceolin; Maurizio De-Santis; Jan Vogel; Laurent Ranno; Hélène Béa; Stefania Pizzini

Published date:--

DOI:10.1103/physrevapplied.21.064023

PDF link:https://link.aps.org/article/10.1103/PhysRevApplied.21.064023

Article link:http://dx.doi.org/10.1103/physrevapplied.21.064023

Article Source:American Physical Society (APS)


Remark:
Reply

Use magic Donate Report

All Reply0 Show all posts

Reply

You have to log in before you can reply Login | Register

Points Rules

Senior Member
  • post

  • reply

  • points

    1040

Latest Reply

Return to the list