journal:IEEE Transactions on Instrumentation and Measurement
Authors:Gang Wang; Mingfeng Lu
Published date:2024--
DOI:10.1109/tim.2024.3415775
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10559858
Article link:http://dx.doi.org/10.1109/tim.2024.3415775
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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