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[IEEE] RTS Noise Reduction in CMOS Image Sensors Using Correlated Extrema Cancellation

845008460 Post time 3 day(s) ago | Show all posts |Read mode
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journal：IEEE Transactions on Electron Devices

Authors：Abhinav Bhattacharya; Tusha Tanya; Mukul Sarkar; Boyd Fowler

Published date：2024-5-

DOI：10.1109/ted.2024.3373725

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10466729

Article link：http://dx.doi.org/10.1109/ted.2024.3373725

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。


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shiroshiro Post time The day before yesterday 11:20 | Show all posts

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