[IEEE] Increasing Accuracy of Crop Production and Yield Forecasting Using Hyper Spectral Image Analysis

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journal:2024 3rd International Conference for Innovation in Technology (INOCON)

Authors:Devendra Singh

Published date:2024-3-1

DOI:10.1109/inocon60754.2024.10511722

PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10511722

Article link:http://dx.doi.org/10.1109/inocon60754.2024.10511722

Article Source:IEEE


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