journal:IEEE Transactions on Industrial Electronics
Authors:Xin Yuan; Shuo Zhang; Chengning Zhang; Alessandro Galassini; Giampaolo Buticchi; Michele Degano
Published date:2021-3-
DOI:10.1109/tie.2020.2973880
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9007627
Article link:http://dx.doi.org/10.1109/tie.2020.2973880
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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