journal:Microelectronics Journal
Authors:Haotian Yu; Yaguang Yang; Daibo Zhang; Qiliang Zhang; Zhiqiang Li
Published date:2024-6-
DOI:10.1016/j.mejo.2024.106193
PDF link:https://www.sciencedirect.com/sc ... 026269224001058/pdf
Article link:http://dx.doi.org/10.1016/j.mejo.2024.106193
Article Source:Elsevier BV。
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