journal:IEEE Transactions on Device and Materials Reliability
Authors:Shijie Liu; Xiaoling Duan; Shulong Wang; Jincheng Zhang; Yue Hao
Published date:2023-6-
DOI:10.1109/tdmr.2023.3246053
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10048499
Article link:http://dx.doi.org/10.1109/tdmr.2023.3246053
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
Remark: |