journal:IEEE Journal of Solid-State Circuits
Authors:Hyunjin Kim; Changhun Park; Inho Park; Taehyeong Park; Seungwoo Park; Chulwoo Kim
Published date:2024-2-
DOI:10.1109/jssc.2023.3297605
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10226610
Article link:http://dx.doi.org/10.1109/jssc.2023.3297605
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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