journal:IEEE Transactions on Instrumentation and Measurement
Authors:Libo Sun; James Bockman; Changming Sun
Published date:2023--
DOI:10.1109/tim.2023.3328708
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10301519
Article link:http://dx.doi.org/10.1109/tim.2023.3328708
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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