journal:IEEE Transactions on Reliability
Authors:Tiantian Xu; Guangjie Han; Hongbo Zhu; Chuan Lin; Jinlin Peng
Published date:2024--
DOI:10.1109/tr.2023.3349201
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10399958
Article link:http://dx.doi.org/10.1109/tr.2023.3349201
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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