[IEEE] Temperature-based Numerical Simulation investigation of the analog performance of AlGaN/GaN MOS-HEMT

pu3aisyah Post time 2024-6-20 09:49:22 | Show all posts |Read mode
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journal:2023 IEEE Devices for Integrated Circuit (DevIC)

Authors:Mann Ruby; Sharma Shobha; Rewari Sonam; R. S. Gupta

Published date:2023-4-7

DOI:10.1109/devic57758.2023.10134957

PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10134957

Article link:http://dx.doi.org/10.1109/devic57758.2023.10134957

Article Source:IEEE


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