journal：IEEE Transactions on Instrumentation and Measurement
Authors：Hong Zeng; Qi Wu; Yanping Jin; Haohao Zheng; Mingming Li; Yue Zhao; Hua Hu; Wanzeng Kong
Published date：2022--
DOI：10.1109/tim.2022.3216829
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9931735
Article link：http://dx.doi.org/10.1109/tim.2022.3216829
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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