journal：IEEE Transactions on Pattern Analysis and Machine Intelligence
Authors：Kai Han; Yunhe Wang; Hanting Chen; Xinghao Chen; Jianyuan Guo; Zhenhua Liu; Yehui Tang; An Xiao; Chunjing Xu; Yixing Xu; Zhaohui Yang; Yiman Zhang; Dacheng Tao
Published date：2023-1-1
DOI：10.1109/tpami.2022.3152247
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9716741
Article link：http://dx.doi.org/10.1109/tpami.2022.3152247
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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https://ieeexplore.ieee.org/abstract/document/9850889
