journal：IEEE Transactions on Pattern Analysis and Machine Intelligence
Authors：Hu Wang; Mao Ye; Xiatian Zhu; Shuai Li; Xue Li; Ce Zhu
Published date：2024-5-
DOI：10.1109/tpami.2023.3346921
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10373884
Article link：http://dx.doi.org/10.1109/tpami.2023.3346921
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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