journal：2023 IEEE International Joint Conference on Biometrics (IJCB)
Authors：Shivang Agarwal; Jyoti Chaudhary; Hard Savani; Shivam Sharma; Mayank Vatsa; Richa Singh; Shyam Prasad Adhikari; Sangeeth Reddy; Kshitij Agrawal; Hemant Misra
Published date：2023-9-25
DOI：10.1109/ijcb57857.2023.10449207
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10449207
Article link：http://dx.doi.org/10.1109/ijcb57857.2023.10449207
Article Source：IEEE。
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