[IEEE] Reliability and robustness of SiC power devices - how to ensure the quality level established in the silicon world

Semicon Post time 2024-6-17 14:44:55 | Show all posts |Read mode
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journal:2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)

Authors:Peter Friedrichs

Published date:2022-5-15

DOI:10.23919/ipec-himeji2022-ecce53331.2022.9807138

PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9807138

Article link:http://dx.doi.org/10.23919/ipec-himeji2022-ecce53331.2022.9807138

Article Source:IEEE


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