journal:IEEE Transactions on Industrial Informatics
Authors:Yan Qin; Stefan Adams; Chau Yuen
Published date:2021-11-
DOI:10.1109/tii.2021.3051048
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9320563
Article link:http://dx.doi.org/10.1109/tii.2021.3051048
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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