journal:IEEE Transactions on Electron Devices
Authors:C. Leurquin; W. Vandendaele; M.-A. Jaud; R. Lavieville; B. Mohamad; C. Masante; G. Despesse; E. Nowak
Published date:2024-5-
DOI:10.1109/ted.2024.3384941
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10505816
Article link:http://dx.doi.org/10.1109/ted.2024.3384941
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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