journal:IEEE Transactions on Industrial Informatics
Authors:Xiaoding Wang; Jia Hu; Hui Lin; Wenxin Liu; Hyeonjoon Moon; Md. Jalil Piran
Published date:2023-7-
DOI:10.1109/tii.2022.3210597
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9906889
Article link:http://dx.doi.org/10.1109/tii.2022.3210597
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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