journal：IEEE Transactions on Electron Devices
Authors：Sapam Bikesh; Aheibam Dinamani Singh; Biraj Shougaijam
Published date：2024-6-
DOI：10.1109/ted.2024.3392173
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10516596
Article link：http://dx.doi.org/10.1109/ted.2024.3392173
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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