journal:2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)
Authors:Tong Jia; Yifan Wu; Chuanjia Hou; Ying Li
Published date:2021-10-
DOI:10.1109/issre52982.2021.00021
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9700306
Article link:http://dx.doi.org/10.1109/issre52982.2021.00021
Article Source:IEEE。
Remark: |