journal：Proceedings of the IEEE
Authors：Y. Kim; D.L. Jaggard
Published date：1986--
DOI：10.1109/proc.1986.13617
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=1457885
Article link：http://dx.doi.org/10.1109/proc.1986.13617
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
Remark： |
10