journal:IEEE Sensors Journal
Authors:Stephen L. Toepp; Martin V. Mohrenschildt; Aimee J. Nelson
Published date:2023-11-15
DOI:10.1109/jsen.2023.3321677
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10287258
Article link:http://dx.doi.org/10.1109/jsen.2023.3321677
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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