journal:IEEE Transactions on Pattern Analysis and Machine Intelligence
Authors:Yan Yan; Elisa Ricci; Ramanathan Subramanian; Gaowen Liu; Oswald Lanz; Nicu Sebe
Published date:2016-6-1
DOI:10.1109/tpami.2015.2477843
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=7254213
Article link:http://dx.doi.org/10.1109/tpami.2015.2477843
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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