journal:IEEE Transactions on Knowledge and Data Engineering
Authors:Tsz Nam Chan; Zhe Li; Leong Hou U; Reynold Cheng
Published date:2023-10-1
DOI:10.1109/tkde.2023.3253263
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10061281
Article link:http://dx.doi.org/10.1109/tkde.2023.3253263
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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