journal:IEEE Transactions on Information Forensics and Security
Authors:Yuanyuan Qing; Tao Bai; Zhuotao Liu; Pierre Moulin; Bihan Wen
Published date:2024--
DOI:10.1109/tifs.2024.3352837
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10404044
Article link:http://dx.doi.org/10.1109/tifs.2024.3352837
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
Remark: |