journal：IEEE Transactions on Industrial Electronics
Authors：Esteban J. Fuentes; César A. Silva; Juan I. Yuz
Published date：2012-7-
DOI：10.1109/tie.2011.2158767
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=5783930
Article link：http://dx.doi.org/10.1109/tie.2011.2158767
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
Remark： |
10