journal：IEEE Transactions on Industrial Informatics
Authors：Ming Liu; Ka Wing Chan; Jiefeng Hu; Wenzheng Xu; Jose Rodriguez
Published date：2019-9-
DOI：10.1109/tii.2019.2898004
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=8637005
Article link：http://dx.doi.org/10.1109/tii.2019.2898004
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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