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[IEEE] Assembly Monitoring Using Semantic Segmentation Network Based on Multiscale Feature Maps and Trainable Guided Filter

GOATofCNU Post time 2024-6-8 19:02:14 | Show all posts |Read mode
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journal：IEEE Transactions on Instrumentation and Measurement

Authors：Chengjun Chen; Chunlin Zhang; Changzhi Li; Jun Hong

Published date：2022--

DOI：10.1109/tim.2022.3204322

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9893205

Article link：http://dx.doi.org/10.1109/tim.2022.3204322

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。


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