journal:IEEE Access
Authors:Dong Wang; Kwok-Leung Tsui; Qiang Miao
Published date:2018--
DOI:10.1109/access.2017.2774261
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=8115325
Article link:http://dx.doi.org/10.1109/access.2017.2774261
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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