journal：IEEE Access
Authors：Hyojeoung Kim; Sujin Park; Hee-Jun Park; Heung-Gu Son; Sahm Kim
Published date：2023--
DOI：10.1109/access.2023.3243252
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10040681
Article link：http://dx.doi.org/10.1109/access.2023.3243252
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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