journal：IEEE Embedded Systems Letters
Authors：Emilio Isaac Baungarten-Leon; Susana Ortega-Cisneros; Uriel Jaramillo-Toral; Francisco J. Rodriguez-Navarrete; L. Pizano-Escalante; J. J. Raygoza Panduro
Published date：2024-3-
DOI：10.1109/les.2023.3267341
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10102657
Article link：http://dx.doi.org/10.1109/les.2023.3267341
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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