journal：IEEE Transactions on Electron Devices
Authors：Shan Li; Zu-Yong Yan; Jin-Cheng Tang; Jian-Ying Yue; Zeng Liu; Pei-Gang Li; Yu-Feng Guo; Wei-Hua Tang
Published date：2022-5-
DOI：10.1109/ted.2022.3156891
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9734230
Article link：http://dx.doi.org/10.1109/ted.2022.3156891
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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