journal:IEEE Transactions on Industrial Electronics
Authors:Ke Li; Wen Ding; Jiangnan Yuan; Changle Du
Published date:2024-2-
DOI:10.1109/tie.2023.3250748
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10061472
Article link:http://dx.doi.org/10.1109/tie.2023.3250748
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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