journal:IEEE Systems Journal
Authors:Dung H. P. Nguyen; Yu-Hui Lien; Bing-Hong Liu; Shao-I Chu; Tu N. Nguyen
Published date:2023-12-
DOI:10.1109/jsyst.2023.3257776
PDF link:https://ieeexplore.ieee.org/iela ... 54/10089243-aam.pdf
Article link:http://dx.doi.org/10.1109/jsyst.2023.3257776
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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