journal:IEEE Transactions on Electron Devices
Authors:Jinsu Jeong; Jun-Sik Yoon; Sanguk Lee; Rock-Hyun Baek
Published date:2023-2-
DOI:10.1109/ted.2022.3231839
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10003131
Article link:http://dx.doi.org/10.1109/ted.2022.3231839
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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