journal：Journal of Semiconductors
Authors：Huabin Yu; Muhammad Hunain Memon; Hongfeng Jia; Haochen Zhang; Meng Tian; Shi Fang; Danhao Wang; Yang Kang; Shudan Xiao; Shibing Long; Haiding Sun
Published date：2022-6-1
DOI：10.1088/1674-4926/43/6/062801
PDF link：https://iopscience.iop.org/article/10.1088/1674-4926/43/6/062801
Article link：http://dx.doi.org/10.1088/1674-4926/43/6/062801
Article Source：IOP Publishing。
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