Cybersecurity Testing Technology in Smart Substations

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journal：IEC 61850-Based Smart Substations

Authors：Yi Yang; Haiqing Xu; Kieran McLaughlin; Sakir Sezer; Haitao Jiang; Wei Huang

Published date：2019--

DOI：10.1016/b978-0-12-815158-7.00007-x

Article link：http://dx.doi.org/10.1016/b978-0-12-815158-7.00007-x

Article Source：Elsevier。

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[Elsevier] Cybersecurity Testing Technology in Smart Substations

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