journal:2023 62nd Annual Conference of the Society of Instrument and Control Engineers (SICE)
Authors:Hector Gautier; Shoichi Maeyama
Published date:2023-9-6
DOI:10.23919/sice59929.2023.10354102
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10354102
Article link:http://dx.doi.org/10.23919/sice59929.2023.10354102
Article Source:IEEE。
Remark: |