journal:IEEE Transactions on Instrumentation and Measurement
Authors:Marcantonio Catelani; Lorenzo Ciani; Romano Fantacci; Gabriele Patrizi; Benedetta Picano
Published date:2021--
DOI:10.1109/tim.2021.3111009
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9530703
Article link:http://dx.doi.org/10.1109/tim.2021.3111009
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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