journal:IEEE Electron Device Letters
Authors:Dong-Guk Kim; Jun-Hyeok Yim; Min-Keun Lee; Myeong-Su Chae; Hyungtak Kim; Ho-Young Cha
Published date:2024-6-
DOI:10.1109/led.2024.3391619
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10505303
Article link:http://dx.doi.org/10.1109/led.2024.3391619
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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