journal：IT Professional
Authors：Alper Yayla; Lida Haghnegahdar; Ersin Dincelli
Published date：2022-9-1
DOI：10.1109/mitp.2022.3163731
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9967407
Article link：http://dx.doi.org/10.1109/mitp.2022.3163731
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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