journal:Solid-State Electronics
Authors:Ye Sle Cha; Junghwan Park; Chanwoo Park; Soogine Chong; Chul-Heung Kim; Chang-Sub Lee; Intae Jeong; Hyunbo Cho
Published date:2022-12-
DOI:10.1016/j.sse.2022.108450
PDF link:https://www.sciencedirect.com/sc ... 038110122002210/pdf
Article link:http://dx.doi.org/10.1016/j.sse.2022.108450
Article Source:Elsevier BV。
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